Universität Bonn

Fachgruppe Biologie

Equipment

This page lists the equipment available at the AIMBIOS facility.

Confocal fluorescence microscopes

  • Optical sectioning of fluorescence-labelled cells and tissue sections
  • Multi-Channel fluorescence imaging
  • Generation of image stacks for 3D reconstruction of samples
  • Automated scanning of large sample areas (tile scanning)
  • Live cell imaging over extended periods of time (incubation chambers)
  • Assays to measure protein dynamics and protein-protein-interactions: FRAP, FRET, BiFC

Location: IZB

  • CLSM with spectral detection
  • large incubation chamber for long-time live cell imaging
  • FRAP-, FRET- and BiFC-analytics

Location: IZB

  • fast and highly sensitive system with incubation system for live cell imaging
  • FRAP-, FRET- und BiFC-analytics

Location: IZB

  • high resolution CLSM with Airy Scan detector and incubation system for live cell imaging
  • FRAP-, FRET- und BiFC-analytics

Location: IZMB

  • spectral CLSM with with GaAsP detector
  • FRET- and BiFC-analytics

Superresolution microscopy system

Location: IG

  • inverted microscope equipped with perfect focus system, N-STORM kit and H-TIRF controller for Stochastical Optical Reconstruction (STORM) microscopy

Epi-fluorescence microscopes

  • Imaging of fluorescence-labelled living or chemically fixed cells
  • Imaging of tissue sections after staining with histologic dyes (bright field mode)

Location: IZB

  • upright system
  • dual camera solution for brightfield and fluorescence imaging

Location: IZB

  • inverted system with Apotom 2 for generating optical sections

Location: BIOB-I

  • upright system

Location: IG

  • inverted system

Location: IG

  • also equipped with 63x air objective

Location: IG

  • upright system

Slide scanning microscopes

  • Automated imaging of microscopic slides

Location: BIOB-I

  • stacking of three-dimensional samples

Location: BIOB-I

  • digital slide scanner for capturing high-resolution images of slides

Equipment for sample preparation - light microscopy

  • Cryo-microtomes for cutting semi-thin sections for fluorescence microscopy
  • Microtomes to generate sections of paraffin-embedded tissues for subsequent histological staining

Location: BIOB-I

  • cutting sections from paraffin-embedded material

Location: IZMB

  • agarose sections for light microscopy

Jung (Location: IZMB)

  • paraffin and Stedman wax sections
  • for light microscopy

Leica RM 2165 (Location: IZB)

  • cutting sections from paraffin-embedded material for histological staining

Location: IZB

  • cutting semi thin sections of frozen tissues for immunofluorescence microscopy

Electron microscopes

  • Scanning EM: Imaging of surfaces with BSE- and SE-detectors yielding material contrast and topographic data, respectively
  • Transmission EM: Imaging of ultra-thin sections and single molecules
  • Immuno-gold detection

 Location: IZB

  • ultra-high-resolution scanning EM with STEM-detector for TEM studies
  • SE-detectors for topography and BSE-detector for material contrast
  • MAPS-Software for imaging large samples ("Tile and Stitch")

Location: BIOB-I

  • high-resolution Tungsten-SEM
  • SE-detector for topography and BSE-detector for material contrast
  • self-made short-time Cryo-Stage

Location: BIOB-I

  • ultra-high-resolution FEG-SEM
  • SE-detectors for topography and BSE-detector for material contrast
  • EDX-detector for elemental characterization
  • Cooling/Heating Stage (-50°C - 100°C)

Equipment for sample preparation - electron microscopy

  • Microtomes to cut ultra-thin sections from resin-embedded samples
  • Sputter coaters and high-vacuum evaporators to prepare samples for SEM or TEM
  • Critical point dryers for preparing SEM samples

Location: IZB

  • ultramicrotomes for cutting ultra-thin resin sections for TEM

Location: BIOB-II

  • ultramicrotomes for cutting ultra-thin resin sections for TEM

Location: IZMB

  • ultramicrotome for cutting ultra-thin resin sections for TEM

Location: IZB

  • sputter coater device for creating an ultra-thin layer of platin/palladium yielding stability and conductivity for SEM samples

Location: IZB

  • high-vacuum evaporation system for generating ultra-fine layers of carbon and platin for contrast and stability for TEM-samples

Location: BIOB-I

  • medium-vacuum evaporation system for generating ultra-fine layers of carbon, palladium or gold for contrast and stability for SEM-samples

Location: IZB - BIOB-I

  • critical-point dryers for SEM samples

Location: BIOB-I

  • critical-Point-Dryer for SEM and µCT samples

Atomic force microscope

  • Measuring and imaging details of surface topography

Location: BIOB-III

Location: BIOB-III

  •  atomic force microscope (AFM) for imaging and measuring surface topography, equipped with nanoindenter (NI) for local measurement of E-module and hardness

X-ray tomograph

  • Non-invasive tomography of small, fresh or dried samples to identify histology and micromorphology

Location: BIOB-II

  •  µComputertomograph (resolution 0.4 µm)
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