Equipment
This page lists the equipment available at the AIMBIOS facility.
- Optical sectioning of fluorescence-labelled cells and tissue sections
- Multi-Channel fluorescence imaging
- Generation of image stacks for 3D reconstruction of samples
- Automated scanning of large sample areas (tile scanning)
- Live cell imaging over extended periods of time (incubation chambers)
- Assays to measure protein dynamics and protein-protein-interactions: FRAP, FRET, BiFC
LSM 710 (Zeiss)
Location: IZB
- CLSM with spectral detection
- large incubation chamber for long-time live cell imaging
- FRAP-, FRET- and BiFC-analytics
Cell Observer SD (Zeiss)
Location: IZB
- fast and highly sensitive system with incubation system for live cell imaging
- FRAP-, FRET- und BiFC-analytics
LSM 900 (Zeiss)
Location: IZB
- high resolution CLSM with Airy Scan detector and incubation system for live cell imaging
- FRAP-, FRET- und BiFC-analytics
SP8 Lightning (Leica)
Location: IZMB
- spectral CLSM with with GaAsP detector
- FRET- and BiFC-analytics
- Imaging of fluorescence-labelled living or chemically fixed cells
- Imaging of tissue sections after staining with histologic dyes (bright field mode)
Axio-Imager.M1 (Zeiss)
Location: IZB
- upright system
- dual camera solution for brightfield and fluorescence imaging
Axio-Observer.Z1 (Zeiss)
Location: IZB
- inverted system with Apotom 2 for generating optical sections
Axio-Imager.M2 (Zeiss)
Location: BIOB-I
- upright system
BZ-9000E (Keyence)
Location: IG
- inverted system
Axiophot (Zeiss)
Location: IG
- also equipped with 63x air objective
DM 5500 (Leica)
Location: IG
- upright system
- Cryo-microtomes for cutting semi-thin sections for fluorescence microscopy
- Microtomes to generate sections of paraffin-embedded tissues for subsequent histological staining
Vibratome/Microtome for histology (Micron)
Location: BIOB-I
- cutting sections from paraffin-embedded material
Vibratome for histology (Jung)
Location: IZMB
- agarose sections for light microscopy
Microtomes for histology
Jung (Location: IZMB)
- paraffin and Stedman wax sections
- for light microscopy
Leica RM 2165 (Location: IZB)
- cutting sections from paraffin-embedded material for histological staining
Cryocut CM 3050 S (Leica)
Location: IZB
- cutting semi thin sections of frozen tissues for immunofluorescence microscopy
- Scanning EM: Imaging of surfaces with BSE- and SE-detectors yielding material contrast and topographic data, respectively
- Transmission EM: Imaging of ultra-thin sections and single molecules
- Immuno-gold detection
SEM Verios 460L (FEI)
Location: IZB
- ultra-high-resolution scanning EM with STEM-detector for TEM studies
- SE-detectors for topography and BSE-detector for material contrast
- MAPS-Software for imaging large samples ("Tile and Stitch")
SEM Stereoscan 200 (Cambridge Instruments)
Location: BIOB-I
- high-resolution Tungsten-SEM
- SE-detector for topography and BSE-detector for material contrast
- self-made short-time Cryo-Stage
Tescan SEM Clara (Tescan)
Location: BIOB-I
- ultra-high-resolution FEG-SEM
- SE-detectors for topography and BSE-detector for material contrast
- EDX-detector for elemental characterization
- Cooling/Heating Stage (-50°C - 100°C)
- Microtomes to cut ultra-thin sections from resin-embedded samples
- Sputter coaters and high-vacuum evaporators to prepare samples for SEM or TEM
- Critical point dryers for preparing SEM samples
Ultracut EM UC7 (Leica)
Location: IZB
- ultramicrotomes for cutting ultra-thin resin sections for TEM
Ultracut S, UC6 (Leica)
Location: BIOB-II
- ultramicrotomes for cutting ultra-thin resin sections for TEM
Ultracut S (Reichert)
Location: IZMB
- ultramicrotome for cutting ultra-thin resin sections for TEM
208 HR (Cressington)
Location: IZB
- sputter coater device for creating an ultra-thin layer of platin/palladium yielding stability and conductivity for SEM samples
EM ACE 600 (Leica)
Location: IZB
- high-vacuum evaporation system for generating ultra-fine layers of carbon and platin for contrast and stability for TEM-samples
EM ACE200 (Leica)
Location: BIOB-I
- medium-vacuum evaporation system for generating ultra-fine layers of carbon, palladium or gold for contrast and stability for SEM-samples
CPD 030 (BAL-TEC)
Location: IZB - BIOB-I
- critical-point dryers for SEM samples
EM CPD300 (Leica)
Location: BIOB-I
- critical-Point-Dryer for SEM and µCT samples
- Measuring and imaging details of surface topography
AFM: Dimension 3100 (Veeco/Bruker)
Location: BIOB-III
NI: Hysitron (TriboScope)
Location: BIOB-III
- atomic force microscope (AFM) for imaging and measuring surface topography, equipped with nanoindenter (NI) for local measurement of E-module and hardness